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Scanning Capacitance Sample
If repositioning is required
The non-magnetic sample holder is included in the Magnetic Force Microscopy (MFM) toolkit (PSIT-0005)
5 Structure: SiC with Steps Single Step Height: 0
They are designed for use with the Direct Drive Fluid Cantilever Holder and 35mm petri dishes and are available as replacement parts in packages of five
NM-RC 95 N/m Scanning Capacitance SampleDESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Nanomechanics Probe, 350 N m, 750kHz, 10nm ROC, 5 Pack. Uncalibrated. These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations
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